DocumentCode :
3220417
Title :
X-ray Sensitivity Measurements On CVD Diamond Film Detectors
Author :
Foulon, F. ; Pochet, T. ; Gheeraert, E.
Author_Institution :
LETI
fYear :
1993
fDate :
31 Oct-6 Nov 1993
Firstpage :
569
Lastpage :
573
Keywords :
Alpha particles; Chemical vapor deposition; Conductivity; Fabrication; Optical pulse generation; Pulsed laser deposition; Radiation detectors; X-ray detection; X-ray detectors; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
Type :
conf
DOI :
10.1109/NSSMIC.1993.701725
Filename :
701725
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3220417
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