Title : 
QeDB: A Quality-Aware Embedded Real-Time Database
         
        
            Author : 
Kang, Woochul ; Son, Sang H. ; Stankovic, John A.
         
        
            Author_Institution : 
Dept. of Comput., Sci. Univ. of Virginia, VA
         
        
        
        
        
        
            Abstract : 
QeDB is a database for data-intensive real-time applications running on flash memory-based embedded systems.Currently, databases for embedded systems are best effort,providing no guarantees on its timeliness and data freshness. Moreover, the existing real-time database (RTDB) technology can not be applied to these embedded databases since they hypothesize that the main memory of a system is large enough to hold all database, which can not be true in data-intensive real-time applications. QeDB uses a novel feedback control scheme to support QoS in such embedded systems without requiring all data to reside in main memory.In particular, our approach is based on simultaneous control of both I/O and CPU resource to guarantee the desired timeliness. Unlike existing work on feedback control of RTDB performance, we actually implement and evaluate the proposed scheme in a modern embedded system.The experimental results show that our approach supports the desired timeliness of transactions while still maintaining high data freshness compared to baseline approaches.
         
        
            Keywords : 
database management systems; flash memories; real-time systems; QoS; data-intensive real-time applications; feedback control scheme; flash memory-based embedded systems; quality-aware embedded real-time database; Application software; Database systems; Delay; Embedded system; Feedback control; Flash memory; Intelligent sensors; Real time systems; Timing; Transaction databases; I/O-aware; MIMO; embedded systems; real-time database; real-time systems;
         
        
        
        
            Conference_Titel : 
Real-Time and Embedded Technology and Applications Symposium, 2009. RTAS 2009. 15th IEEE
         
        
            Conference_Location : 
San Francisco, CA
         
        
        
            Print_ISBN : 
978-0-7695-3636-1
         
        
        
            DOI : 
10.1109/RTAS.2009.31