Title :
Recognition of plane projective symmetry
Author :
Curwen, Rupert W. ; Mundy, Joseph L. ; Stewart, Charles
Author_Institution :
Gen. Electr. Corp. Res. & Dev., Niskayuna, NY, USA
Abstract :
A novel approach to grouping symmetrical planar curves under a projective transform is described. Symmetric curves are important as a generic model for object recognition where an object class is defined by the set of symmetries that any object in the class obeys. In this paper, a new algorithm is presented for grouping curves based on their correspondence under a plane projectivity. The correspondence between curves is defined by a rational parameterization based on a pencil of lines constructed from two distinguished points on the curves, such as inflection points. A saliency measure is introduced which permits grouping results to be ordered in terms of the degree of symmetry supported by each curve pair. This saliency measure provides a basis for recognition in the case of approximate symmetry
Keywords :
object recognition; pattern classification; correspondence; generic model; inflection points; object class; object recognition; plane projective symmetry; plane projectivity; rational parameterization; saliency measure; symmetrical planar curves; Contracts; Geometry; Humans; Layout; Monitoring; Object recognition; Research and development; Solid modeling; US Government;
Conference_Titel :
Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
Conference_Location :
Sacramento, CA
Print_ISBN :
0-7803-3694-1
DOI :
10.1109/MWSCAS.1997.662219