DocumentCode :
3220667
Title :
A methodological evaluation on discharge phenomena at different temperatures in internal gaseous interfaces inside filled and unfilled epoxy resins used in HV components
Author :
Gagliardo, V. ; Pompili, M. ; Schifani, R.
Author_Institution :
Dipartimento di Ingegneria Elettrica, Palermo Univ., Italy
fYear :
1992
fDate :
22-25 Jun 1992
Firstpage :
171
Lastpage :
175
Abstract :
The authors report an experimental investigation carried out to obtain information on epoxy material performance under partial discharge (PD) activity for different temperature conditions. Some observations about the effect of filler mineral charges on the electrical behavior of epoxy resins are also reported. It is noted that PD activity and temperature play an important role in the life of the insulating materials, reducing noticeably the reliability of HV (high-voltage) systems. The use of a multichannel analysis allows a more detailed diagnosis of PD activity in the insulating materials. From 20 to 80°C, it has been noted that the PDAD (PD amplitude distribution) shape changes and a number of the PDs of smaller amplitude increase in such a way as to produce a higher total charge transferred to the dielectric material. The increase of the total charge transferred to the dielectric materials due to the higher temperature and the voltage leads to a faster degradation of the material, reducing the useful life of the system
Keywords :
filled polymers; high-voltage engineering; organic insulating materials; partial discharges; polymers; 20 to 80 degC; HV components; PD activity; PD amplitude distribution; discharge phenomena; electrical behavior; filled epoxy resins; filler mineral; high-voltage; insulating materials; internal gaseous interfaces; multichannel analysis; partial discharge; reliability; unfilled epoxy resins; Degradation; Dielectric materials; Dielectrics and electrical insulation; Epoxy resins; Materials reliability; Minerals; Partial discharges; Shape; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
Type :
conf
DOI :
10.1109/ICSD.1992.224981
Filename :
224981
Link To Document :
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