Title :
A perturbation based fault modeling and simulation for mixed-signal circuits
Author :
Ben-Hamida, Naim ; Saab, Khaled ; Marche, David ; Kaminska, Bozena
Author_Institution :
OPMAXX Inc., Beaverton, OR., USA
Abstract :
The areas of analog circuit fault simulation and test generation have not witnessed the same degree of success as their digital counterparts. This is due mainly to the complexity of analog behavior and the lack of a fault mode. We present a new functional fault modeling technique called the perturbation fault model. The perturbation fault model is based on an estimation of the distance between the responses of the faulty and fault-free circuit and their distributions. The model allows fault abstraction of physical defects through structural fault modeling and perturbation estimation. The fault simulation technique uses a linear estimation of the faulty and fault-free output circuits. Techniques for fault observation and propagation are presented in order to build a hierarchical analog fault simulator
Keywords :
CMOS analogue integrated circuits; analogue circuits; fault diagnosis; integrated circuit modelling; mixed analogue-digital integrated circuits; perturbation techniques; CMOS; analog circuit fault simulation; complexity; fault abstraction; fault observation; functional fault modeling; hierarchical analog fault simulator; mixed-signal circuits; perturbation estimation; perturbation fault model; physical defects; structural fault modeling; test generation; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Fluctuations; Large-scale systems; Signal design; Signal processing; Transfer functions;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643956