DocumentCode
3220781
Title
Analog signal metrology for mixed signal ICs
Author
Su, Chauchin ; Cheng, Yi-Ren ; Chen, Yue-Tsang ; Tenchen, Shing
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
fYear
1997
fDate
17-19 Nov 1997
Firstpage
194
Lastpage
199
Abstract
Signal reconstruction reconstructs a multiple period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20 MHz 8-bit ADC
Keywords
analogue-digital conversion; automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; signal reconstruction; 20 MHz; Analog signal metrology; DSP based testing; Signal reconstruction; high-rate sampled waveform; mixed signal IC; multiple period low-rate sampled waveform; on-chip ADC; Amplitude shift keying; Band pass filters; Baseband; Circuit testing; Demodulation; Digital filters; Digital signal processing chips; Metrology; Phase locked loops; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location
Akita
ISSN
1081-7735
Print_ISBN
0-8186-8209-4
Type
conf
DOI
10.1109/ATS.1997.643958
Filename
643958
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