Title :
Analog signal metrology for mixed signal ICs
Author :
Su, Chauchin ; Cheng, Yi-Ren ; Chen, Yue-Tsang ; Tenchen, Shing
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Abstract :
Signal reconstruction reconstructs a multiple period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20 MHz 8-bit ADC
Keywords :
analogue-digital conversion; automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; signal reconstruction; 20 MHz; Analog signal metrology; DSP based testing; Signal reconstruction; high-rate sampled waveform; mixed signal IC; multiple period low-rate sampled waveform; on-chip ADC; Amplitude shift keying; Band pass filters; Baseband; Circuit testing; Demodulation; Digital filters; Digital signal processing chips; Metrology; Phase locked loops; Radio frequency;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643958
