Title :
Nano-structure fabrication and manipulation by the cantilever oscillation of an atomic force microscope
Author :
Hyon, C.K. ; Choi, S.C. ; Hwang, S.W. ; Ahn, D. ; Yong Kim ; Kim, E.K.
Author_Institution :
Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
Abstract :
The authors report the direct fabrication and manipulation of nano-structures by using the cantilever oscillation of an atomic force microscope (AFM). The oscillating cantilever exerts a large enough force to break the surface bond and subsequently remove the atoms. Various reliable groove patterns on GaAs, with fully controlled width and depth, are achieved by adjusting the feedback gain of the AFM and the applied force. Furthermore, the selection and the subsequent removal of individual InAs self-assembled quantum dots is also shown to be possible.
Keywords :
III-V semiconductors; atomic force microscopy; bonds (chemical); gallium arsenide; indium compounds; nanostructured materials; nanotechnology; self-assembly; semiconductor quantum dots; surface treatment; AFM; GaAs; GaAs-InAs; InAs self-assembled quantum dots; atomic force microscope; cantilever oscillation; feedback gain; groove patterns; manipulation; nano-structure fabrication; surface bond; Atomic force microscopy; Atomic layer deposition; Fabrication; Force control; Force feedback; Gallium arsenide; Information processing; Pattern formation; Quantum dots; Semiconductor materials;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
Conference_Location :
Yokohama, Japan
Print_ISBN :
4-930813-97-2
DOI :
10.1109/IMNC.1999.797471