Title :
A novel Features from Accelerated Segment Test algorithm based on LBP on image matching
Author :
Guo, Lisha ; Li, Junshan ; Zhu, YingHong ; Tang, ZongQi
Author_Institution :
Xi´´an Res. Inst. of High-tech, Xi´´an, China
Abstract :
Since the FAST (Features from Accelerated Segment Test) detector is much faster than any of the commonly used detection algorithms, and the repeatability and efficiency of FAST-9 are best in the FAST family, we proposed a novel LBP descriptor based on FAST-9 algorithm. Firstly, feature points are detected by FAST-9 and then, the texture information of the interesting point neighborhood is studied with the proposed Fast LBP descriptor named F-LBP, structured the 256-bit descriptor of the interesting point, which effectively reduced the computational complexity of the descriptor. Finally, the descriptor matching is carried out with the logical XNOR. The experimental results show that the proposed algorithm has got good repeatability, efficiency, the rotation invariance, the affine invariance and the illumination invariance in the process of image matching.
Keywords :
affine transforms; computational complexity; image matching; image segmentation; logic gates; FAST family; FAST-9; accelerated segment test; affine invariance; computational complexity; descriptor matching; detection algorithms; experimental; fast LBP descriptor; feature points; illumination invariance; image matching; local binary mode; logical XNOR; rotation invariance; texture information; Algorithm design and analysis; Detectors; Eigenvalues and eigenfunctions; Feature extraction; Image matching; Image segmentation; Lighting; FAST (Features from Accelerated Segment Test); Feature description; Local binary patterns (LBP); Local features; image matching;
Conference_Titel :
Communication Software and Networks (ICCSN), 2011 IEEE 3rd International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-61284-485-5
DOI :
10.1109/ICCSN.2011.6013732