Title :
Dielectric spectroscopy of XLPE cable insulation: comparison between time-domain and frequency-domain methods
Author :
Fourmigue, J.M. ; Parpal, J.-L. ; Séguin, J.N.
Author_Institution :
Electr. de France, Paris, France
Abstract :
Dielectric relaxation measurements were conducted on XLPE (cross-linked polyethylene) insulation samples extracted at different radial positions from laboratory-aged (24 kV/mm) cables in order to determine if they were an appropriate diagnostic for detecting change in the dielectric properties of cable insulation aged under high electric stress. Time-domain and frequency-domain spectroscopy measurements were performed on the same samples in order to evaluate the reliability of these methods. The dielectric parameters show a marked dispersion with the radial position of the samples from the inner to the outer semiconductors. The slightly, but systematically, higher average loss tangents found for the aged samples were within the dispersion. Hence, at this time, no evident correlation with electrical ageing can be inferred, and more detailed studies, as well as more intense ageing, are needed for definitive conclusions
Keywords :
cable insulation; cable testing; dielectric losses; dielectric measurement; dielectric properties of solids; dielectric relaxation; insulation testing; organic insulating materials; polymers; power cables; spectroscopy; XLPE cable insulation; aged samples; cross-linked polyethylene; dielectric properties; dielectric spectroscopy; electrical ageing; frequency-domain methods; high electric stress; loss tangents; radial position; reliability; Aging; Cable insulation; Dielectric measurements; Dielectrics and electrical insulation; Electric variables measurement; Electrochemical impedance spectroscopy; Laboratories; Polyethylene; Position measurement; Stress measurement;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
DOI :
10.1109/ICSD.1992.224995