• DocumentCode
    3220985
  • Title

    An engineering model for moisture degradation of polymer/metal interfacial fracture toughness

  • Author

    Ferguson, Timothy P. ; Qu, Jianmin

  • Author_Institution
    Georgia W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2005
  • fDate
    16-18 March 2005
  • Firstpage
    298
  • Lastpage
    301
  • Abstract
    Based on interfacial fracture mechanics and the hydrophobicity of the interface, en engineering model was developed in this paper. Using this model, one can predicted the degradation of interfacial fracture toughness of a polymer/metal interface once the moisture concentration near the interface is known.
  • Keywords
    composite material interfaces; failure analysis; filled polymers; fracture mechanics; interface roughness; semiconductor process modelling; semiconductor-insulator boundaries; engineering model; interface hydrophobicity; interfacial fracture mechanics; moisture concentration; moisture degradation; polymer-metal interfacial fracture toughness; Adhesives; Copper; Electronic mail; Electrostatics; Mechanical engineering; Moisture; Polymers; Predictive models; Thermal degradation; Thermodynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
  • ISSN
    1550-5723
  • Print_ISBN
    0-7803-9085-7
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2005.1432093
  • Filename
    1432093