Title :
On the complexity of universal fault diagnosis for look-up table FPGAs
Author :
Inoue, Tomoo ; Miyazaki, Satoshi ; Fujiwara, Hideo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
Abstract :
In this paper, we introduce universal fault diagnosis such that when applied to an unprogrammed FPGA, it locates a fault in any faulty programmed FPGA corresponding to the unprogrammed FPGA. If a faulty part in an FPGA can be identified prior to programming it, we can implement a required logic function on the fault-free part by isolating the faulty part. Then, we propose a universal fault diagnosis procedure that locates a faulty CLB in a look-up table FPGA. The complexity of the universal diagnosis procedure for FPGAs with block-sliced loading is independent of its array size, i.e., C-diagnosable
Keywords :
automatic testing; fault diagnosis; field programmable gate arrays; logic testing; table lookup; C-diagnosable array; FPGA; SRAM; architecture; block-sliced loading; faulty CLB; look-up table; universal fault diagnosis; Circuit faults; Circuit testing; Fault diagnosis; Field programmable gate arrays; Functional programming; Information science; Integrated circuit interconnections; Logic programming; Logic testing; Table lookup;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643970