Breakdown strength of cross-linked polyethylene affected by semiconducting electrode interface condition

Cable specimens with 3.5 mm insulation thickness made of different kinds of modified semiconducting materials were investigated in terms of the impulse breakdown strength and the lamella angle. Several specimens showed improvements in 50% and 1% Weibull breakdown strength. 50% Weibull breakdown strength was improved about 10% and 1% Weibul breakdown strength was improved by about 40%. The lamella angle, which is one of the parameters that characterizes the hyperstructure of XLPE (cross-linked polyethylene) insulation at the semiconducting interface in a cable specimen, was considered. A strong correlation between the breakdown strength of XLPE power cables and the lamella angle was found