• DocumentCode
    3221049
  • Title

    Automatic inspection system for billet

  • Author

    Chuang, Bo-I ; Hsu, Wen-Cheng ; Chen, Chung-Mei ; Hor, Chiou-Yi ; Sun, Yung-Nien

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2011
  • fDate
    16-18 Nov. 2011
  • Firstpage
    58
  • Lastpage
    62
  • Abstract
    In billet production, the quality of billet is an important issue to assure. In this study, we proposed an automatic inspection system to locate and classify defects for billet. The proposed system is consisted of three modules: (1) image processing and defect location, (2) feature extraction and selection, (3) incremental learning classifier. In the first module, the region of interest is extracted and normalized to reduce the effects of uneven illumination. We then develop two methods to detect different types of defects based on their characteristics. In the second module, k-nearest neighbor classifier and tabu search are employed to select the best set of features for classification. In the last module, a classifier with incremental learning capability called Learn++ is used to classify the detected defects. Experiments show that the proposed system provides defect detection with good accuracy and speed. Comparing with the conventional BPN, the Learn++ classifier is much more efficient in training and obtains better classification rates.
  • Keywords
    billets; feature extraction; image classification; inspection; learning (artificial intelligence); production engineering computing; quality control; search problems; BPN; Learn++ classifier; automatic inspection system; billet production; billet quality; defect classification; defect location; feature extraction; feature selection; image processing; incremental learning classifier; k-nearest neighbor classifier; region of interest; tabu search; Billets; Classification algorithms; Feature extraction; Inspection; Training; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Image Processing Applications (ICSIPA), 2011 IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4577-0243-3
  • Type

    conf

  • DOI
    10.1109/ICSIPA.2011.6144096
  • Filename
    6144096