DocumentCode :
3221106
Title :
Identification of life model parameters for electro-thermally stressed PET films
Author :
Chudzinski, K. ; Cacciari, M. ; Gubanski, S.M. ; Kempski, A. ; Montanari, G.C.
Author_Institution :
Sch. of Eng., Zielona Gora, Poland
fYear :
1992
fDate :
22-25 Jun 1992
Firstpage :
423
Lastpage :
427
Abstract :
Electrical and multistress life tests were performed on 50-μm-thick, biaxially stretched PET (polyethylene terephthalate) films that were aged with stainless steel contact electrodes at temperatures of 20, 60, 110, 130, and 150°C and under 0.5, 0.65, 0.8, 1.0, 1.5, 2.0, and 2.5 kV at 50 Hz. Analysis shows that life data for simultaneous thermal and electric aging of PET films can be described by curvilinear threshold life models, especially for lower aging temperatures. A good data fit is obtained for both exponential and inverse power models, although the temperature dependences of the threshold value indicate that the exponential models describe the material´s physical behavior better. Exceeding the glass transition temperature does not cause significant changes in the threshold value, whereas aging at higher temperatures, where recrystallization takes place, influences the electrical threshold strongly
Keywords :
ageing; electric field effects; life testing; polymer films; recrystallisation; thermal stresses; 0.5 kV; 0.65 kV; 0.8 kV; 1.0 kV; 1.5 kV; 110 degC; 130 degC; 150 degC; 2.0 kV; 2.5 kV; 20 degC; 50 Hz; 50 micron; 60 degC; biaxially stretched films; curvilinear threshold life models; electric aging; electrical threshold; electro-thermally stressed PET films; exponential models; glass transition temperature; inverse power models; life data; life model parameters; multistress life tests; polyethylene terephthalate; polymer films; recrystallization; stainless steel contact electrodes; temperature dependences; thermal aging; Aging; Contacts; Electrodes; Life testing; Performance evaluation; Plastic films; Polyethylene; Positron emission tomography; Steel; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
Type :
conf
DOI :
10.1109/ICSD.1992.225004
Filename :
225004
Link To Document :
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