• DocumentCode
    3221124
  • Title

    Satellite master oscillators

  • Author

    Emmons, D.A. ; Martin, D.W. ; Garvey, R.M.

  • Author_Institution
    Frequency & Time Syst. Inc., Beverley, MA, USA
  • fYear
    1995
  • fDate
    31 May-2 Jun 1995
  • Firstpage
    600
  • Lastpage
    613
  • Abstract
    Quartz oscillators which serve as the time and frequency references on satellite missions are called upon to meet stringent performance requirements. Recent applications call for the best possible stabilities and low noise performance while at the same time demanding features such as high resolution remote digital tuning, which can potentially compromise ultimate stability. In this paper, we present test results and a discussion of some design criteria and strategies for meeting requirements of high precision, survivability and reliability. Long term testing of Allan deviation is described, and aging rate results in the low e-11 range are presented. High resolution test methods and results for radiation sensitivity screening are discussed, with particular reference to low dose testing. Resonator sensitivities in the 1e-11 per rad range for a 4 rad/hour exposure have been observed for 4 MHz adhered electrode SC-cut resonators
  • Keywords
    ageing; circuit reliability; circuit tuning; crystal oscillators; quartz; space vehicle electronics; Allan deviation; adhered electrode SC-cut resonators; aging rate results; design criteria; frequency reference; low dose testing; low noise performance; precision; quartz oscillators; radiation sensitivity screening; reliability; remote digital tuning; resonator sensitivities; satellite master oscillators; survivability; time reference; Aging; Electric shock; Frequency estimation; Oscillators; Ovens; Satellites; Stability; Temperature control; Testing; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2500-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1995.484060
  • Filename
    484060