• DocumentCode
    3221143
  • Title

    Digital-analog and analog-digital converters based on single-electron and MOS transistors

  • Author

    Li, Qin ; Cai, Li ; Wu, Gang

  • Author_Institution
    Sci. Inst., Air Force Eng. Univ. of CPLA, Xi´´an, China
  • fYear
    2010
  • fDate
    9-11 June 2010
  • Firstpage
    1562
  • Lastpage
    1566
  • Abstract
    Two kinds of novel converter circuits containing single-electron transistors and MOS transistors are proposed. The proposed Digital to Analog Converter (DAC) circuit and Analog to Digital Converter (ADC) circuit are both improved in the base of the pure SET and SET/MOS hybrid circuits that were designed by other research groups, so they possess the merits of both SET and MOS circuits. Through the analysis for the device parameters and operating temperature, the proper circuit parameters are selected. The accuracies of the 4-bit DAC circuit and 3-bit ADC circuit are validated by SPICE. Compared with the pure SET circuits, not only the driving capability, but also the swing of output signal has been enhanced in the novel converter. Compared with the other SET/MOS hybrid circuit, the novel converter has compact circuit structure, higher integration density and lower power depletion.
  • Keywords
    MOSFET; analogue-digital conversion; digital-analogue conversion; single electron transistors; 3-bit ADC circuit; 4-bit DAC circuit; MOS transistors; SET-MOS hybrid circuits; analog-digital converters; compact circuit structure; digital-analog converter; high integration density; lower power depletion; single-electron transistors; word length 3 bit; word length 4 bit; Analog-digital conversion; Automatic control; CMOS technology; Capacitance; Circuits; Digital-analog conversion; MOSFETs; Power dissipation; SPICE; Single electron transistors; MOS; Periodic symmetric function; Single Electron Transistor; analog-digital converter; digital-analog converter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Automation (ICCA), 2010 8th IEEE International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    1948-3449
  • Print_ISBN
    978-1-4244-5195-1
  • Electronic_ISBN
    1948-3449
  • Type

    conf

  • DOI
    10.1109/ICCA.2010.5524394
  • Filename
    5524394