Title :
μ-PIXE analysis of impurity migration in polyethylene
Author :
Houdayer, A.J. ; Hinrichsen, P.F. ; Kajrys, G. ; Parpal, J.-L. ; Fourmigue, J.M. ; Crine, J.-P.
Author_Institution :
Lab. de Faisceaux d´´Ions, Montreal Univ., Que., Canada
Abstract :
The authors have investigated the impurity distributions in the polyethylene adjacent to the inner and outer semiconducting-polyethylene interface in a field-aged cable sample, and in some laboratory samples aged in contact with NaCl or KCl, CuSO4, and CaF2 salt solutions. PIXE (proton-induced X-ray-emission) analysis of the samples was performed. Two samples from the same extruded XLPE (cross-linked polyethylene) 90-kV cable were studied. One was kept as a reference unaged sample. Detailed scans of the distributions of Si and S in the XLPE insulation of the aged sample adjacent to the interfaces with both the outer shield and the inner semiconductor provided no convincing evidence of migration of these elements across the interfaces
Keywords :
X-ray chemical analysis; ageing; cable insulation; conducting polymers; electrolytes; elemental semiconductors; impurity distribution; ion microprobe analysis; organic insulating materials; semiconductor-insulator boundaries; silicon; sulphur; μ-PIXE analysis; 90 kV; CaF2; CuSO4; KCl; NaCl; S; Si; XLPE insulation; cross-linked polyethylene; extruded XLPE; field-aged cable sample; impurity distributions; impurity migration; laboratory samples; polyethylene; proton-induced X-ray-emission; reference unaged sample; semiconducting-polyethylene interface; Aging; Cable insulation; Conductors; Electric fields; Impurities; Laboratories; Performance analysis; Polyethylene; Spatial resolution; Voltage;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
DOI :
10.1109/ICSD.1992.225006
