DocumentCode
3221220
Title
BIST testability enhancement using high level test synthesis for behavioral and structural designs
Author
Lai, Kowen ; Papachrist, Christos A. ; Baklashov, Mikhail
Author_Institution
Rockwell Semicond. Syst., Newport Beach, CA, USA
fYear
1997
fDate
17-19 Nov 1997
Firstpage
338
Lastpage
343
Abstract
In this paper we will show how high level test synthesis can achieve higher testability for BIST oriented test methodologies. Our results show considering testability during high-level synthesis, better testability can be obtained when compared to DFT at low level
Keywords
built-in self test; design for testability; high level synthesis; logic testing; BIST testability; DFT; behavioral designs; controllability; fidelity; high level test synthesis; industrial benchmark; observability; structural designs; transparency; Built-in self-test; Circuit synthesis; Circuit testing; Controllability; Design for testability; High level synthesis; Observability; Semiconductor device testing; Signal synthesis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location
Akita
ISSN
1081-7735
Print_ISBN
0-8186-8209-4
Type
conf
DOI
10.1109/ATS.1997.643980
Filename
643980
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