New results on high perfection langasite crystals: studies of crystalline defects and mode shapes

Author

Zarka, A. ; Capelle, B. ; Detaint, J. ; Cochet-Muchy, D.

Author_Institution

CNRS, Paris, France

fYear

1995

fDate

31 May-2 Jun 1995

Firstpage

629

Lastpage

637

Abstract

Langasite (LGS: La₃Ga₅SiO₁₄) is a new piezoelectric material obtained by the Czochralski method. In this paper we present results obtained on new samples which are more representative of the crystalline quality achieved with this material. Observations using X-ray transmission topography have permitted verification of the quality of samples of different origins and to analyse the nature of their crystalline defects. Vibration modes of different types of devices made with LGS have been studied by X-ray transmission topography. This study was essentially concerned with plane or plano-convex resonators. This material has interesting properties and among them compensated cuts with a large coupling coefficient and a very reduced angular sensitivity

Keywords

X-ray topography; crystal defects; crystal growth from melt; crystal resonators; gallium compounds; lanthanum compounds; piezoelectric materials; Czochralski method; La₃Ga₅SiO₁₄; X-ray transmission topography; angular sensitivity; coupling coefficient; crystalline defects; langasite; mode shapes; piezoelectric material; plano-convex resonators; vibration modes; Couplings; Crystalline materials; Crystallization; Crystals; Diffraction; Electrodes; Piezoelectric materials; Shape; Solvents; Surface topography;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-2500-1

Type

conf

DOI

10.1109/FREQ.1995.484064

Filename

484064