Title :
Surface and volume defects in langasite crystals
Author :
Sakharov, S.A. ; Pisarevsky, Yu. ; Medvedev, A.V. ; Senushencov, P.A. ; Lider, V.
fDate :
31 May-2 Jun 1995
Abstract :
Volume defects of langasite crystals were investigated by optical and X-ray methods. Procedure of mechanical and chemical treatment was developed. Study of surface defects was made by electronographical and optical methods. Samples of resonators with various volume defects and surface treatment were investigated. Based on chemical etching technology monolithic 80 MHz filter was designed and prepared
Keywords :
X-ray diffraction; crystal defects; crystal filters; crystal resonators; etching; gallium compounds; lanthanum compounds; piezoelectric materials; surface topography; 80 MHz; La3Ga5SiO14; X-ray methods; chemical etching technology; chemical treatment; crystal filter; crystal resonators; electronographical methods; langasite crystals; optical methods; surface defects; surface treatment; volume defects; Chemicals; Crystals; Internal stresses; Optical attenuators; Optical distortion; Optical filters; Optical polarization; Optical resonators; Optical surface waves; Surface treatment;
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
DOI :
10.1109/FREQ.1995.484066
