Title :
Breakdown statistics as a tool to investigate electrical aging
Author :
Chauvet, C. ; Laurent, C.
Author_Institution :
Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
Abstract :
The statistics of short-term dielectric breakdown derived from a given test procedure is shown to be a very sensitive tool for investigating small changes in the dielectric properties of insulation. The most complete characterization encompasses all the parameters of the Weibull distribution, including the location parameter. When the sampling is very homogeneous and the other experimental parameters are well under control, the plot in a two-parameter Weibull representation exhibits a regular downward curvature. This indicates a threshold that is a true characteristic of the population. The samples studied were cross-linked polyethylene slices 200 μm thick and 40×40 mm2 in section cut from the insulation of a power cable. The aging time was varied between 250 and 9000 hours. The two-parameter Weibull distribution of the 750-hours-aged population is displayed with its 90% confidence bounds
Keywords :
ageing; cable insulation; electric breakdown of solids; organic insulating materials; polymer films; statistical analysis; 200 micron; 250 hours; 750 hours; Weibull distribution; aging time; cable insulation; cross-linked polyethylene slices; dielectric properties; electrical aging; location parameter; power cable; regular downward curvature; sampling; short-term dielectric breakdown; threshold; two-parameter distribution; Aging; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Insulation testing; Sampling methods; Statistical analysis; Statistical distributions; Statistics; Weibull distribution;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
DOI :
10.1109/ICSD.1992.225015
