Title :
Supply current test for unit-to-unit variations of electrical characteristics in gates
Author :
Hashizume, Masaki ; Kuchii, Toshimasa ; Tamesada, Takeomi
Author_Institution :
Fac. of Eng., Tokushima Univ., Japan
Abstract :
A practical supply current test method is proposed and the experimental evaluation results are presented. In the method, the unit-to-unit variation of electrical characteristics in each logic gate is modeled as a Gaussian distribution and faults are detected with a statistical hypothesis technique
Keywords :
Gaussian distribution; characteristics measurement; electric current measurement; integrated circuit testing; integrated logic circuits; logic testing; production testing; statistical analysis; CMOS IC testing; Gaussian distribution; bipolar IC testing; electrical characteristics; faults; logic gate; statistical hypothesis; supply current test; unit-to-unit variations; CMOS logic circuits; Circuit faults; Circuit testing; Current supplies; Electric variables; Electrical fault detection; Gaussian distribution; Logic circuits; Logic testing; Semiconductor device modeling;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643985
