Title :
Built-in current sensor designs based on the bulk-driven technique
Author :
Huang, Tsung-Chu ; Huang, Min-Cheng ; Lee, Muen-Jong
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead
Keywords :
CMOS integrated circuits; SPICE; built-in self test; electric current measurement; electric sensing devices; integrated circuit measurement; 0.3 V; 0.3 ns; IDDQ testing; accuracy; area overhead; biasing schemes; built-in current sensor; bulk-driven current mirror; circuit speed degradation; external power supply; flexibility; low power dissipation; power supply voltage drop; simplicity; Circuit testing; Costs; Degradation; Delay; Low voltage; Mirrors; Monitoring; Power dissipation; Power supplies; Test equipment;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643987