Title :
Experimental observation of high velocity pseudo-SAWs in ZnO/diamond/Si multilayers
Author :
Dreifus, D.L. ; Higgins, R.J. ; Henard, R.B. ; Almar, R. ; Solie, L.P.
Author_Institution :
Electron. Mater. Center, Kobe Steel USA Inc., NC, USA
Abstract :
In the past few years, high-velocity surface acoustic wave (SAW) devices have been demonstrated using multilayers containing diamond. These devices have exhibited SAW phase velocities as large as 10 km/s. The high velocities attainable in diamond-based multilayer systems enables the fabrication of high frequency (>2 GHz) SAW devices without requiring submicron device fabrication technologies. Furthermore, higher velocity pseudo-SAWs (PSAWs) with theoretically calculated velocities approaching 18 km/s have also been predicted. In this work, high velocity pseudo-SAWs have been experimentally observed in a ZnO/diamond/Si multilayer. The fabricated SAW devices were delay line structures with uniform transducers on the ZnO surface, and metal shorting planes at the ZnO/diamond interface. Electrical characterization has been made via RF probing, and SAW and PSAW responses have been observed. Of particular interest is a high velocity PSAW with a phase velocity in excess of 16 km/s. The results are in good agreement with simulated dispersive relationships for this multilayer system
Keywords :
II-VI semiconductors; acoustic wave velocity; diamond; elemental semiconductors; silicon; surface acoustic wave delay lines; surface acoustic wave transducers; surface acoustic waves; zinc compounds; PSAW responses; RF probing; SAW devices; SAW phase velocities; ZnO-C-Si; ZnO/diamond interface; ZnO/diamond/Si multilayers; delay line structures; electrical characterization; fabrication; high frequency; high velocity pseudo-SAWs; metal shorting planes; phase velocity; signal processing; uniform transducers; Acoustic waves; Delay lines; Dispersion; Fabrication; Nonhomogeneous media; Radio frequency; Surface acoustic wave devices; Surface acoustic waves; Transducers; Zinc oxide;
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-4153-8
DOI :
10.1109/ULTSYM.1997.663008