Synchrotron radiation topography of thick swept quartz

Author

Suzuki, C.K. ; Zhang, X.W. ; Ando, M. ; Yoda, Y. ; Kikuta, S. ; Hamaguchi, K. ; Nagai, K. ; Taki, S.

Author_Institution

Fac. of Eng., Univ. Estadual de Campinas, Sao Paulo, Brazil

fYear

1995

fDate

31 May-2 Jun 1995

Firstpage

679

Lastpage

684

Abstract

Ag- and Au-diffusion swept synthetic quartz samples as thick as 10 mm along the [202¯0] direction were characterized by synchrotron radiation topography at a superconducting vertical wiggler beamline of Photon Factory. The high resolution topographic image allows the visualization of the Ag (Au) diffusion paths along the Z-direction. The stereographic pair topographs can ben used to reproduce the 3-dimensional configuration of the dislocation network. Based on the diffracted and direct (transmitted) images of swept and unswept quartz some new hypotheses concerning the etch-channel suppression mechanism are presented

Keywords

X-ray topography; crystal resonators; quartz; synchrotron radiation; wigglers; 10 mm; SiO₂; X-ray topography; crystal resonators; dislocation network; electrodiffusion; etch-channel suppression mechanism; high resolution topographic image; stereographic pair topographs; superconducting vertical wiggler beamline; swept quartz; synchrotron radiation topography; three-dimensional configuration; Crystallization; Etching; Gold; Impurities; Power engineering and energy; Production facilities; Surfaces; Synchrotron radiation; X-ray diffraction; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-2500-1

Type

conf

DOI

10.1109/FREQ.1995.484072

Filename

484072