DocumentCode :
3221450
Title :
Thermal desorption of quartz crystals
Author :
Murray, R.A. ; Pierce, D.E. ; Lareau, R. ; Laffey, S. ; Vig, J.R.
Author_Institution :
U.S. Army Res. Lab., Fort Monmouth, NJ, USA
fYear :
1995
fDate :
31 May-2 Jun 1995
Firstpage :
696
Lastpage :
704
Abstract :
Thermal desorption mass spectroscopy was used to measure the outgassing of water and ammonia from quartz wafers after different processing steps typically used in resonator fabrication. The activation energies of the two species were calculated and compared with a test bakeout. It was determined that the water could be represented well by multiple activation energies. The effect this has on bakeout parameters is discussed. Also discussed are the possible sites where water and ammonia may be bound to the quartz surface. It was determined that part of the ammonia that was detected in these experiments originates in the vacuum system. Although UV ozone cleaning is primarily used to remove carbonaceous contaminants, it was found to substantially reduce the amount of ammonia desorbing from quartz samples
Keywords :
crystal resonators; mass spectra; piezoelectric materials; quartz; surface cleaning; thermally stimulated desorption; H2O; NH3; SiO2; UV ozone cleaning; activation energies; ammonia; bakeout; carbonaceous contaminants; outgassing; quartz crystals; resonator fabrication; thermal desorption mass spectroscopy; vacuum system; water; Aging; Cleaning; Crystals; Etching; Fabrication; Mass spectroscopy; Pollution measurement; Resistance heating; Surface contamination; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
Type :
conf
DOI :
10.1109/FREQ.1995.484074
Filename :
484074
Link To Document :
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