• DocumentCode
    3221475
  • Title

    Piezoelectrically forced thickness-shear and flexural vibrations of contoured quartz resonators

  • Author

    Lee, P.C.Y. ; Wang, Ji

  • Author_Institution
    Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
  • fYear
    1995
  • fDate
    31 May-2 Jun 1995
  • Firstpage
    705
  • Lastpage
    715
  • Abstract
    In a previous paper, a set of first-order equations of motion was obtained for contoured crystal plates and for frequencies up to and including those of the fundamental thickness-shear modes. In the present paper, the governing equations of contoured plates are extended to include the electric potential which is coupled to the mechanical fields by the piezoelectric effect. These equations are, then, employed for the study of piezoelectrically forced thickness-shear and flexural vibrations of beveled AT-cut quartz plate, i.e., the plate with a portion of uniform thickness between the two wings of the double wedge. Analytical solutions are obtained by the Frobenius method. Displacements, stresses, and electric potential are derivable from six independent functions which are in the form of an infinite power series. In addition to the calculations of resonance frequencies and mode shapes, the effect of the contouring on the forced mechanical displacements, electric potential, surface charge, and capacitance ratio are examined
  • Keywords
    crystal resonators; quartz; vibrations; Frobenius method; SiO2; beveled AT-cut quartz crystal plate; capacitance ratio; contoured quartz resonators; electric potential; equations of motion; flexural vibrations; mechanical displacements; mode shapes; piezoelectrically forced vibrations; power series; resonance frequencies; stresses; surface charge; thickness-shear vibrations; Capacitance; Civil engineering; Electric potential; Frequency; Integral equations; Operations research; Piezoelectric effect; Resonance; Stress; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2500-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1995.484075
  • Filename
    484075