• DocumentCode
    3221543
  • Title

    Lee´s plate equations with new correction factors and analysis of spurious vibrations of rectangular AT-cut quartz plates

  • Author

    Sekimoto, Hitoshi ; Tajima, Daisuke ; Watanabe, Yasuaki ; Ishizaki, Akio

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Tokyo Metropolitan Univ., Japan
  • fYear
    1995
  • fDate
    31 May-2 Jun 1995
  • Firstpage
    746
  • Lastpage
    749
  • Abstract
    Strip AT-cut quartz resonators have been recently developed and widely used in frequency applications because of their small size. Many spurious resonances can be supported in a rectangular AT-cut plate. Therefore, the analysis of the influence of both the X and Z´ dimensions of the plate upon the spurious characteristics is necessary to design the strip resonators. However, it is very difficult to exactly solve three dimensional equations of elasticity. The practical analysis of spurious characteristics has been carried out on the basis of approximate two dimensional equations. In this paper, the applicability of Lee´s two dimensional equations to AT-cut plates is examined. The resonant frequencies are calculated as a function of X-length, and are compared to Koga´s experimental data. The result shows that new correction factors should be introduced in the equations in order to adjust the approximate values of wave numbers for the thickness-flexure waves propagating in X and Z´ directions
  • Keywords
    crystal resonators; quartz; vibrations; Lee two dimensional equations; SiO2; correction factors; rectangular AT-cut quartz plates; resonant frequencies; spurious vibrations; strip resonators; thickness-flexure waves; Degradation; Elasticity; Equations; Fourier series; Information analysis; Resonance; Resonant frequency; Stress; Strips; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2500-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1995.484079
  • Filename
    484079