Title :
Exoelectron spectroscopy of near-surface defects in insulators
Author_Institution :
Inst. of Phys., Estonian Acad. of Sci., Tartu, Estonia
Abstract :
Summary form only given. The author discusses exoelectron emission (EE) as an analytic and diagnostic technique, surveying its advantages, shortcomings, and potential applications in the physics and technology of dielectric materials. Some possible ways to accommodate EE better for R&D purposes are outlined
Keywords :
electron traps; exoelectron emission; insulating materials; insulation testing; exoelectron emission; near-surface defects; traps; Chemicals; Dielectric materials; Dielectrics and electrical insulation; Electrochemical impedance spectroscopy; Electron emission; Electron traps; Luminescence; Physics; Research and development; Surface treatment;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
DOI :
10.1109/ICSD.1992.225027
