DocumentCode
3221550
Title
Exoelectron spectroscopy of near-surface defects in insulators
Author
Kaambre, Hem
Author_Institution
Inst. of Phys., Estonian Acad. of Sci., Tartu, Estonia
fYear
1992
fDate
22-25 Jun 1992
Firstpage
556
Abstract
Summary form only given. The author discusses exoelectron emission (EE) as an analytic and diagnostic technique, surveying its advantages, shortcomings, and potential applications in the physics and technology of dielectric materials. Some possible ways to accommodate EE better for R&D purposes are outlined
Keywords
electron traps; exoelectron emission; insulating materials; insulation testing; exoelectron emission; near-surface defects; traps; Chemicals; Dielectric materials; Dielectrics and electrical insulation; Electrochemical impedance spectroscopy; Electron emission; Electron traps; Luminescence; Physics; Research and development; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location
Sestri Levante
Print_ISBN
0-7803-0129-3
Type
conf
DOI
10.1109/ICSD.1992.225027
Filename
225027
Link To Document