Title :
Multiple apodized self-correlating tapped delay line for ID-tag and sensor applications
Author :
Vandahl, Th ; Klett, St. ; Buff, W.
Author_Institution :
Inst. of Solid-State Electron., Tech. Hochschule Ilmenau, Germany
Abstract :
A special SAW device design, derived from conventional tapped delay lines and optimized for wireless interrogation as a two-terminal ID-tag and sensor, is presented. The working principle is based on superposition of the correlation signals of multiple apodized transducer pairs that are connected in parallel. In the device, every transducer (tap) works as both, receiver and transmitter. Design rules for calculating the apodization of multiple transducers for a given PSK-code sequence are discussed under consideration of second order effects. Optimization criteria for low-loss design of diffraction-compensated devices are addressed. Measurement results for designs with and without diffraction compensation are shown and device characteristics are derived from the results. The measured ID-tag samples were fabricated on a 128°-YX-LiNbO3 substrate to operate at 433.92 MHz
Keywords :
identification; phase shift keying; surface acoustic wave correlation; surface acoustic wave delay lines; surface acoustic wave sensors; 433.92 MHz; ID-tag; LiNbO3; LiNbO3 substrate; PSK-code sequence; SAW device; apodization; diffraction compensation; low-loss design; multiple transducers; optimization; self-correlating tapped delay line; wireless sensor; Apertures; Delay lines; Design optimization; Diffraction; Frequency; Phase shift keying; Surface acoustic wave devices; Surface acoustic waves; Transducers; Wireless sensor networks;
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-4153-8
DOI :
10.1109/ULTSYM.1997.663037