Notch sensors-a new signal processing method for interrogation of passive SAW sensors

Author

Pohl, A. ; Ostermayer, G. ; Reindl, L. ; Seifert, F.

Author_Institution

Appl. Electron. Lab., Vienna Univ. of Technol., Austria

Volume

1

fYear

1997

fDate

5-8 Oct 1997

Firstpage

355

Abstract

A new signal processing method for wireless interrogation of a passive SAW sensor with multiple reflectors, utilizing the signal interference during overlap of the sensor´s response bursts is introduced. Within this time interval, the amplitude or the phase, respectively, is measured. By varying the frequency of the relatively long interrogation bursts, destructive interferences (notches) are searched. So the measurand influencing the sensor or its identification information can be gained. The principle yields high resolution using a low cost interrogating system. The principle, the hardware effort and experimental results for temperature measurements are presented

Keywords

acoustic wave interference; surface acoustic wave sensors; surface acoustic wave signal processing; temperature sensors; identification; multiple reflectors; notch sensor; passive SAW sensor; signal interference; signal processing; temperature measurement; wireless interrogation; Costs; Frequency; Gain measurement; Hardware; Interference; Phase measurement; Signal processing; Surface acoustic waves; Time measurement; Wireless sensor networks;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE

Conference_Location

Toronto, Ont.

ISSN

1051-0117

Print_ISBN

0-7803-4153-8

Type

conf

DOI

10.1109/ULTSYM.1997.663038

Filename

663038