DocumentCode :
3221587
Title :
SEI level 3 compliance in the TPS industry
Author :
Pressler, David R.
Author_Institution :
C-17 Support Equipt., McDonnell Douglas Corp., Long Beach, CA, USA
fYear :
1997
fDate :
22-25 Sep 1997
Firstpage :
688
Lastpage :
697
Abstract :
Over the past 40 years, the strategic planning concept evolved at an increasing rate. Practical applications of strategic planning are now being fine-tuned, and the continued studies of strategy have reached what is referred to in academia as “third generation”. McDonnell Douglas Corporation (MDC) C-17 Support Equipment (SE) is engaged in strategically motivated integrated product teams and process improvement activities to International Standards Organization (ISO) and Software Engineering Institute (SEI) standards. The Test Program Set (TPS) organization is pursuing SEI Level 3 compliance by the end of 1997. The TPS industry is inherently a straightforward and regimented software development environment. It would therefore appear that attainment of SEI Level 3 compliance could be achieved with ease. The report constitutes a reality check, a snapshot of the MDC C-17 SE TPS department´s process improvement effort at publication, and assesses the operational and strategic health of the department due to the SEI Level 3 compliance effort
Keywords :
ISO standards; aircraft testing; automatic test equipment; electronic equipment testing; maintenance engineering; military aircraft; military avionics; military standards; software development management; software quality; C-17 Support Equipment; ISO; International Standards Organization; McDonnell Douglas Corporation; SEI level 3 compliance; Software Engineering Institute standards; TPS industry; TPS maintenance; Test Program Set; integrated product teams; software development; strategic planning; third generation; Aerospace electronics; Aerospace industry; Environmental economics; ISO standards; Manufacturing industries; Software engineering; Software standards; Standards organizations; Strategic planning; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
Type :
conf
DOI :
10.1109/AUTEST.1997.643996
Filename :
643996
Link To Document :
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