• DocumentCode
    3221611
  • Title

    LTCC Technology at High Millimetre Wave Frequencies

  • Author

    Henry, M. ; Free, C.E. ; Reynolds, Q. ; Malkmus, S. ; Wood, J.

  • Author_Institution
    Adv. Technol. Inst., Surrey Univ.
  • Volume
    2
  • fYear
    2006
  • fDate
    5-7 Sept. 2006
  • Firstpage
    696
  • Lastpage
    701
  • Abstract
    Low temperature co-fired ceramic technology (LTCC) has become a viable technology for many millimetre wave applications. In this paper, the dielectric properties of a typical LTCC tape are presented, including relative permittivity, dielectric loss factor and loss tangent. LTCC interconnection losses including dielectric loss, conductor loss and surface roughness loss are also discussed in detail. A scanning electron microscope (SEM) was used to examine the surfaces of the thick-film gold conductors and the significance of surface roughness is discussed with respect to skin depth at these high frequencies. The results of a simple, but novel, experiment illustrating the effect of controlling the surface roughness at millimetre wave frequencies are also presented
  • Keywords
    ceramic packaging; conductors (electric); millimetre waves; permittivity; scanning electron microscopes; surface roughness; LTCC technology; SEM; conductor loss; dielectric loss factor; dielectric properties; high millimetre wave frequencies; low temperature co-fired ceramic technology; relative permittivity; scanning electron microscope; surface roughness loss; thick-film gold conductors; Ceramics; Conductors; Dielectric losses; Frequency; Millimeter wave technology; Permittivity; Rough surfaces; Scanning electron microscopy; Surface roughness; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Systemintegration Technology Conference, 2006. 1st
  • Conference_Location
    Dresden
  • Print_ISBN
    1-4244-0552-1
  • Electronic_ISBN
    1-4244-0553-x
  • Type

    conf

  • DOI
    10.1109/ESTC.2006.280087
  • Filename
    4060812