DocumentCode
3221611
Title
LTCC Technology at High Millimetre Wave Frequencies
Author
Henry, M. ; Free, C.E. ; Reynolds, Q. ; Malkmus, S. ; Wood, J.
Author_Institution
Adv. Technol. Inst., Surrey Univ.
Volume
2
fYear
2006
fDate
5-7 Sept. 2006
Firstpage
696
Lastpage
701
Abstract
Low temperature co-fired ceramic technology (LTCC) has become a viable technology for many millimetre wave applications. In this paper, the dielectric properties of a typical LTCC tape are presented, including relative permittivity, dielectric loss factor and loss tangent. LTCC interconnection losses including dielectric loss, conductor loss and surface roughness loss are also discussed in detail. A scanning electron microscope (SEM) was used to examine the surfaces of the thick-film gold conductors and the significance of surface roughness is discussed with respect to skin depth at these high frequencies. The results of a simple, but novel, experiment illustrating the effect of controlling the surface roughness at millimetre wave frequencies are also presented
Keywords
ceramic packaging; conductors (electric); millimetre waves; permittivity; scanning electron microscopes; surface roughness; LTCC technology; SEM; conductor loss; dielectric loss factor; dielectric properties; high millimetre wave frequencies; low temperature co-fired ceramic technology; relative permittivity; scanning electron microscope; surface roughness loss; thick-film gold conductors; Ceramics; Conductors; Dielectric losses; Frequency; Millimeter wave technology; Permittivity; Rough surfaces; Scanning electron microscopy; Surface roughness; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location
Dresden
Print_ISBN
1-4244-0552-1
Electronic_ISBN
1-4244-0553-x
Type
conf
DOI
10.1109/ESTC.2006.280087
Filename
4060812
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