DocumentCode :
3221611
Title :
LTCC Technology at High Millimetre Wave Frequencies
Author :
Henry, M. ; Free, C.E. ; Reynolds, Q. ; Malkmus, S. ; Wood, J.
Author_Institution :
Adv. Technol. Inst., Surrey Univ.
Volume :
2
fYear :
2006
fDate :
5-7 Sept. 2006
Firstpage :
696
Lastpage :
701
Abstract :
Low temperature co-fired ceramic technology (LTCC) has become a viable technology for many millimetre wave applications. In this paper, the dielectric properties of a typical LTCC tape are presented, including relative permittivity, dielectric loss factor and loss tangent. LTCC interconnection losses including dielectric loss, conductor loss and surface roughness loss are also discussed in detail. A scanning electron microscope (SEM) was used to examine the surfaces of the thick-film gold conductors and the significance of surface roughness is discussed with respect to skin depth at these high frequencies. The results of a simple, but novel, experiment illustrating the effect of controlling the surface roughness at millimetre wave frequencies are also presented
Keywords :
ceramic packaging; conductors (electric); millimetre waves; permittivity; scanning electron microscopes; surface roughness; LTCC technology; SEM; conductor loss; dielectric loss factor; dielectric properties; high millimetre wave frequencies; low temperature co-fired ceramic technology; relative permittivity; scanning electron microscope; surface roughness loss; thick-film gold conductors; Ceramics; Conductors; Dielectric losses; Frequency; Millimeter wave technology; Permittivity; Rough surfaces; Scanning electron microscopy; Surface roughness; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Electronic_ISBN :
1-4244-0553-x
Type :
conf
DOI :
10.1109/ESTC.2006.280087
Filename :
4060812
Link To Document :
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