DocumentCode :
3221698
Title :
Glitch elimination by gate freezing, gate sizing and buffer insertion for low power optimization circuit
Author :
Lee, Hyungwoo ; Shin, Hakgun ; Kim, Juho
Author_Institution :
Comput. Sci. Dept., Sogang Univ., Seoul, South Korea
Volume :
3
fYear :
2004
fDate :
2-6 Nov. 2004
Firstpage :
2126
Abstract :
One of the major factors contributing to the power dissipation in CMOS digital circuits is the switching activity. Many of such switching activities include spurious pulses, called glitches. In this paper, we propose a new method of glitch reduction by gate freezing, gate sizing, and buffer insertion. The proposed method unifies gate freezing, gate sizing, and buffer insertion into a single optimization process to maximize the glitch reduction. The effectiveness of our method is verified experimentally using LGSynth91 benchmark circuits with a 0.5um standard cell library. Our optimization method reduces glitches by 65.64% and the power by 31.03% on average.
Keywords :
CMOS digital integrated circuits; buffer circuits; cellular arrays; circuit optimisation; integrated circuit design; low-power electronics; power consumption; CMOS digital circuit; LGSynth91 benchmark circuit; buffer insertion; gate freezing; gate sizing; glitch elimination; low power optimization circuit; power dissipation; standard cell library; CMOS digital integrated circuits; Capacitance; Circuit synthesis; Computer science; Delay; Digital circuits; Optimization methods; Power dissipation; Software libraries; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE
Print_ISBN :
0-7803-8730-9
Type :
conf
DOI :
10.1109/IECON.2004.1432125
Filename :
1432125
Link To Document :
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