• DocumentCode
    3221698
  • Title

    Glitch elimination by gate freezing, gate sizing and buffer insertion for low power optimization circuit

  • Author

    Lee, Hyungwoo ; Shin, Hakgun ; Kim, Juho

  • Author_Institution
    Comput. Sci. Dept., Sogang Univ., Seoul, South Korea
  • Volume
    3
  • fYear
    2004
  • fDate
    2-6 Nov. 2004
  • Firstpage
    2126
  • Abstract
    One of the major factors contributing to the power dissipation in CMOS digital circuits is the switching activity. Many of such switching activities include spurious pulses, called glitches. In this paper, we propose a new method of glitch reduction by gate freezing, gate sizing, and buffer insertion. The proposed method unifies gate freezing, gate sizing, and buffer insertion into a single optimization process to maximize the glitch reduction. The effectiveness of our method is verified experimentally using LGSynth91 benchmark circuits with a 0.5um standard cell library. Our optimization method reduces glitches by 65.64% and the power by 31.03% on average.
  • Keywords
    CMOS digital integrated circuits; buffer circuits; cellular arrays; circuit optimisation; integrated circuit design; low-power electronics; power consumption; CMOS digital circuit; LGSynth91 benchmark circuit; buffer insertion; gate freezing; gate sizing; glitch elimination; low power optimization circuit; power dissipation; standard cell library; CMOS digital integrated circuits; Capacitance; Circuit synthesis; Computer science; Delay; Digital circuits; Optimization methods; Power dissipation; Software libraries; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE
  • Print_ISBN
    0-7803-8730-9
  • Type

    conf

  • DOI
    10.1109/IECON.2004.1432125
  • Filename
    1432125