DocumentCode
3221698
Title
Glitch elimination by gate freezing, gate sizing and buffer insertion for low power optimization circuit
Author
Lee, Hyungwoo ; Shin, Hakgun ; Kim, Juho
Author_Institution
Comput. Sci. Dept., Sogang Univ., Seoul, South Korea
Volume
3
fYear
2004
fDate
2-6 Nov. 2004
Firstpage
2126
Abstract
One of the major factors contributing to the power dissipation in CMOS digital circuits is the switching activity. Many of such switching activities include spurious pulses, called glitches. In this paper, we propose a new method of glitch reduction by gate freezing, gate sizing, and buffer insertion. The proposed method unifies gate freezing, gate sizing, and buffer insertion into a single optimization process to maximize the glitch reduction. The effectiveness of our method is verified experimentally using LGSynth91 benchmark circuits with a 0.5um standard cell library. Our optimization method reduces glitches by 65.64% and the power by 31.03% on average.
Keywords
CMOS digital integrated circuits; buffer circuits; cellular arrays; circuit optimisation; integrated circuit design; low-power electronics; power consumption; CMOS digital circuit; LGSynth91 benchmark circuit; buffer insertion; gate freezing; gate sizing; glitch elimination; low power optimization circuit; power dissipation; standard cell library; CMOS digital integrated circuits; Capacitance; Circuit synthesis; Computer science; Delay; Digital circuits; Optimization methods; Power dissipation; Software libraries; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE
Print_ISBN
0-7803-8730-9
Type
conf
DOI
10.1109/IECON.2004.1432125
Filename
1432125
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