DocumentCode :
3221723
Title :
Thermal Fatigue Life Evaluation of Aluminum Wire Bonds
Author :
Matsunaga, Toshihiro ; Uegai, Yasumi
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo
Volume :
2
fYear :
2006
fDate :
5-7 Sept. 2006
Firstpage :
726
Lastpage :
731
Abstract :
For a reliability design, it is necessary to evaluate of the effects of thermal fatigue on Al wire bond´s lifetime quantitatively due to the repetitive turning on and off a high current on a semiconductor power module. In this paper, we investigate the relationships among the thermal cycling temperature swing range DeltaT, the thermal cycling period, the maximum junction temperature Tmax, and number of cycles to failure N/using a fast thermal cycling test method we developed. Furthermore, with the aim of predicting the power cycling lifetime, we examined whether the cumulative fatigue damage law can be applied to evaluation of wire bond lifetime
Keywords :
aluminium; lead bonding; life testing; thermal stress cracking; Al; aluminum wire bonds; fatigue damage law; life evaluation; power cycling lifetime; reliability design; thermal cycling temperature; thermal cycling test; thermal fatigue; wire bond lifetime; Aluminum; Bonding; Fatigue; Heat sinks; Life testing; Multichip modules; Temperature distribution; Thermal loading; Thermal stresses; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Electronic_ISBN :
1-4244-0553-x
Type :
conf
DOI :
10.1109/ESTC.2006.280092
Filename :
4060817
Link To Document :
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