DocumentCode :
322174
Title :
Accuracy of resonant ultrasound spectroscopy: an experimental study
Author :
Renken, M.C. ; Kim, S. ; Hollman, K.W. ; Fortunko, C.M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
1
fYear :
1997
fDate :
5-8 Oct 1997
Firstpage :
483
Abstract :
We use resonant ultrasound spectroscopy (RUS) to routinely determine elastic-stiffness coefficients. To establish the uncertainty of RUS, we determined the longitudinal wave velocity in a cylinder (25.6 mm×25.4 mm diam.) of fused silica using three different ultrasonic time-of-flight measurement geometries and four different signal-analysis techniques. We carried out these measurements from 1 MHz to 20 MHz with usable bandwidths of at least 80% of the center frequency. Also, our short-pulse analyses accounted for diffraction, temperature differences, and pulse shape. From these measurements we determined the “true” velocity to be 5932.3 m/s ±0.13% with a 95% confidence interval. We used the RUS technique on the same specimen, operating from 60 kHz to 300 kHz. The RUS result is 5934.5 m/s, which differs from this “true” velocity by 0.04%. Our study shows that the RUS technique has an accuracy that is at least comparable to our best laboratory time-of-flight methods
Keywords :
elastic constants; elastic moduli measurement; silicon compounds; ultrasonic materials testing; ultrasonic velocity; ultrasonic velocity measurement; 1 to 20 MHz; 25.6 to 25.4 mm; 60 to 300 kHz; RUS technique; SiO2; cylinder; diffraction effects; elastic-stiffness coefficients; fused silica; longitudinal wave velocity; pulse shape; resonant ultrasound spectroscopy; short-pulse analyses; signal-analysis techniques; temperature differences; ultrasonic time-of-flight measurement geometries; usable bandwidths; Bandwidth; Diffraction; Frequency measurement; Geometry; Resonance; Silicon compounds; Spectroscopy; Ultrasonic imaging; Ultrasonic variables measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1051-0117
Print_ISBN :
0-7803-4153-8
Type :
conf
DOI :
10.1109/ULTSYM.1997.663068
Filename :
663068
Link To Document :
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