Title :
HRTEM study on the structure of Ge nanoparticles by using a UHV-MBE-TEM system
Author :
Wu, Y. ; Takeguchi, M. ; Furuya, K.
Author_Institution :
Nat. Res. Inst. for Metals, Ibaraki, Japan
Abstract :
Ge nanoparticles smaller than 4 nm in diameter were deposited on Si TEM samples and directly transferred into TEM using a UHV-MBE-TEM system. The structure of some nanoparticles was different from diamond structure. Some Ge nanocrystals even become amorphous and then fluctuate during HRTEM observation.
Keywords :
elemental semiconductors; germanium; nanostructured materials; transmission electron microscopy; Ge; HRTEM; UHV-MBE-TEM system; amorphous state; nanoparticles; Amorphous materials; Atom optics; Contamination; Diffraction; Lattices; Nanocrystals; Nanoparticles; Nanostructures; Shape; Turning;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
Conference_Location :
Yokohama, Japan
Print_ISBN :
4-930813-97-2
DOI :
10.1109/IMNC.1999.797517
