Dependence of photostriction on sample thickness and surface roughness for PLZT ceramics

Author

Poosanaas, Patcharin ; Dogan, A. ; Thakoor, S. ; Uchino, K.

Author_Institution

Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA

Volume

1

fYear

1997

fDate

5-8 Oct 1997

Firstpage

553

Abstract

The ferroelectric materials with high photovoltaic properties are of interest for the new optical devices such as photostrictive ceramic actuators. In pursuit of these high performance photostrictive materials, the present research examines the influence of sample thickness and surface roughness on photostriction of WO₃ doped PLZT ceramics. A model for the calculation of optimum sample thickness having maximum photostrictive response is proposed. This model agrees well with the experimental results, and it will help in designing the photostrictive devices

Keywords

electrostriction; ferroelectric materials; lanthanum compounds; lead compounds; photovoltaic effects; piezoceramics; surface topography; tungsten compounds; PLZT ceramics; PLZT:WO₃; PbLaZrO3TiO3:WO3; WO₃ doped PLZT ceramics; ferroelectric materials; high photovoltaic properties; maximum photostrictive response; photostriction; photostrictive ceramic actuators; photostrictive devices; sample thickness; surface roughness; Absorption; Actuators; Ceramics; Ferroelectric materials; Laboratories; Optical materials; Photovoltaic systems; Rough surfaces; Solar power generation; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE

Conference_Location

Toronto, Ont.

ISSN

1051-0117

Print_ISBN

0-7803-4153-8

Type

conf

DOI

10.1109/ULTSYM.1997.663082

Filename

663082