DocumentCode :
322187
Title :
Dependence of photostriction on sample thickness and surface roughness for PLZT ceramics
Author :
Poosanaas, Patcharin ; Dogan, A. ; Thakoor, S. ; Uchino, K.
Author_Institution :
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Volume :
1
fYear :
1997
fDate :
5-8 Oct 1997
Firstpage :
553
Abstract :
The ferroelectric materials with high photovoltaic properties are of interest for the new optical devices such as photostrictive ceramic actuators. In pursuit of these high performance photostrictive materials, the present research examines the influence of sample thickness and surface roughness on photostriction of WO3 doped PLZT ceramics. A model for the calculation of optimum sample thickness having maximum photostrictive response is proposed. This model agrees well with the experimental results, and it will help in designing the photostrictive devices
Keywords :
electrostriction; ferroelectric materials; lanthanum compounds; lead compounds; photovoltaic effects; piezoceramics; surface topography; tungsten compounds; PLZT ceramics; PLZT:WO3; PbLaZrO3TiO3:WO3; WO3 doped PLZT ceramics; ferroelectric materials; high photovoltaic properties; maximum photostrictive response; photostriction; photostrictive ceramic actuators; photostrictive devices; sample thickness; surface roughness; Absorption; Actuators; Ceramics; Ferroelectric materials; Laboratories; Optical materials; Photovoltaic systems; Rough surfaces; Solar power generation; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1051-0117
Print_ISBN :
0-7803-4153-8
Type :
conf
DOI :
10.1109/ULTSYM.1997.663082
Filename :
663082
Link To Document :
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