• DocumentCode
    3221948
  • Title

    Analysis of polarization of secondary electrons emitted from magnetic materials

  • Author

    Tamura, K. ; Yasuda, H. ; Murata, K. ; Koike, K. ; Kotera, M.

  • Author_Institution
    Dept. of Phys. & Electron., Osaka Prefectural Univ., Sakai, Japan
  • fYear
    1999
  • fDate
    6-8 July 1999
  • Firstpage
    162
  • Lastpage
    163
  • Abstract
    The polarization phenomenon of secondary elections scattered from magnetic materials has important applications in the field of magnetic measurement, such as spin polarization scanning electron microscopy and spin polarization secondary electron spectroscopy. The study of the polarization phenomenon of secondary electrons gives a better understanding of the information obtained by those methods. Therefore, it is important to analyze secondary electron emission from the magnetic materials considering the electron spin. The energy distribution and primary energy dependence of the polarization of secondary electrons have been studied experimentally for a few decades. Here, the spin polarization of secondary electrons emitted from a permalloy material is calculated as functions of the energy and the incident angle of primary electrons. The validity of the simulation is confirmed by a comparison with experimental results.
  • Keywords
    Monte Carlo methods; Permalloy; ferromagnetic materials; secondary electron emission; spin polarised electron emission; NiFe; permalloy; secondary elections polarised emission; spin polarization; Electron emission; Magnetic analysis; Magnetic force microscopy; Magnetic materials; Magnetic variables measurement; Nominations and elections; Polarization; Scanning electron microscopy; Scattering; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
  • Conference_Location
    Yokohama, Japan
  • Print_ISBN
    4-930813-97-2
  • Type

    conf

  • DOI
    10.1109/IMNC.1999.797527
  • Filename
    797527