• DocumentCode
    3222034
  • Title

    Low stress silver-glass die attach material

  • Author

    Nguyen, My N.

  • Author_Institution
    Johnson Matthey Electron. Inc., San Diego, CA, USA
  • fYear
    1989
  • fDate
    25-27 Sep 1989
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    The sintering characteristics of a silver-filled lead borate glass composite were studied since it influences die stresses. This is especially true for very-large-area die attachments. The kinetics of silver particle sintering in the presence of liquid-phase glass was examined by dilatometry and electron microscopy. During heat treatment, the sintering rate is significantly increased after the glass becomes liquid. This can cause excessive die stresses, resulting in cracks, typically at the die-bond interface, and/or poor adhesion. The sintering process is influenced by material parameters such as silver flake surface area, glass transition temperature, and additives, and by process profiles such as temperature ramp rate and dwell time. It was found that, by adding a small amount of appropriate additives, it is possible to either increase or decrease the sintering rate significantly. Thus, stress relief in large-area dice can be achieved by using additives in silver-glass to control the sintering rate
  • Keywords
    borate glasses; composite materials; electron microscope examination of materials; extensometers; heat treatment; powder technology; sintering; PbO-B2O3:Ag; adhesion; cracks; die attach material; die stresses; die-bond interface; dilatometry; dwell time; electron microscopy; glass transition temperature; heat treatment; liquid-phase glass; silver flake surface area; sintering characteristics; temperature ramp rate; Additives; Adhesives; Electron microscopy; Glass; Heat treatment; Kinetic theory; Microassembly; Silver; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Seventh IEEE/CHMT International
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1109/EMTS.1989.68979
  • Filename
    68979