Accident Analysis to Avoid PPM Peaks on Purchased Semiconductors Components

Accidents are sudden but random, economically severe quality problems during product development or delivery with failure rates higher than 100ppm. Several recent cases were studied to derive common features which allow a classification of the events. Focused on semiconductor front end technology the interface between design and process technology and the currently strong process-oriented quality approach were found to be sources for accidents. As an alternative a product function oriented view is proposed which entails e.g. new statistical process control methods. The measures will have to be identified and set up together with the semiconductor industry