DocumentCode :
3222285
Title :
Development of Carbon Nanotube Bumps for Ultra Fine Pitch Flip Chip Interconnection
Author :
Wang, Teng ; Jonsson, Martin ; Campbell, Eleanor E.B. ; Liu, Johan
Author_Institution :
Dept. of Microtechnol. & Nanoscience, Chalmers Univ. of Technol., Goteborg
Volume :
2
fYear :
2006
fDate :
5-7 Sept. 2006
Firstpage :
892
Lastpage :
895
Abstract :
Since 1991, carbon nanotubes have been considered for successful applications in various fields due to their unique properties. In the present work, carbon nanotubes are applied in integrated circuit packaging, as the bump interconnection for flip chip. The reason for choosing carbon nanotubes as the bump material is their special electrical, mechanical and thermal properties, which may promote both the performance and reliability of the flip chip packaging. Moreover, carbon nanotubes can be formed according to a precisely predefined small-scale pattern, which makes extremely high density interconnection possible. Vertically aligned carbon nanotubes are grown on silicon in the form of square arrays of different sizes, heights and pitches. Attempts to use thermal compression and anisotropic conductive adhesive to bond chips carrying carbon nanotube bumps with ceramic substrates are also executed. Mechanical testing is performed afterward to determine the strength of the bonding interfaces. The strength of the bonding by thermal compression is very weak, in the range from 1.9 to 7.0 g/mm2. The bonding by anisotropic conductive adhesive is much stronger, indicating a possible approach to bond chips carrying carbon nanotube bumps
Keywords :
carbon nanotubes; conductive adhesives; electric properties; fine-pitch technology; flip-chip devices; integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; mechanical properties; mechanical testing; silicon; thermal properties; Si; anisotropic conductive adhesive; bonding interfaces; bump interconnection; bump material; carbon nanotube bumps; ceramic substrates; electrical properties; flip chip packaging; integrated circuit packaging; mechanical properties; mechanical testing; thermal compression; thermal properties; ultra fine pitch flip chip interconnection; Anisotropic magnetoresistance; Bonding; Carbon nanotubes; Conductive adhesives; Flip chip; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit reliability; Mechanical factors; Organic materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Electronic_ISBN :
1-4244-0553-x
Type :
conf
DOI :
10.1109/ESTC.2006.280117
Filename :
4060842
Link To Document :
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