DocumentCode :
3222326
Title :
Modeling of irregular boron diffusion profiles over varied surface topologies
Author :
Rumpf, Robert ; Suzuki, Kenichiro
Author_Institution :
Silicon Syst. Res. Lab., NEC Corp., Ibaraki, Japan
fYear :
1999
fDate :
6-8 July 1999
Firstpage :
198
Lastpage :
199
Abstract :
Summary form only given. Recently, several different MEMS (Micro Electro Mechanical Systems) devices, which were designed for use in inkjet printers, capacitive pressure sensors, drug delivery devices, chemical reactors, and other similar applications, have included narrow gaps and small holes. We have found a novel technique to fabricate narrow gaps or small holes based on the high boron diffusion etch stop technique. This technique utilizes a boron diffusion anomaly in a narrow space. Such an anomaly has not been reported before and the fabricated structures are very different to what would be expected. In addition, the data from the investigation of these structures serve to point out some interesting new assumptions and suggest a mechanism and method to simulate boron diffusion profiles over a variety of surfaces. This paper describes this new boron diffusion simulator that can predict boron diffusion profiles and details the success of the simulations.
Keywords :
boron; diffusion; doping profiles; elemental semiconductors; micromechanical devices; silicon; MEMS; Si:B; diffusion anomaly; diffusion profiles; etch stop technique; narrow gaps; small holes; surface topology; Boron; Capacitive sensors; Chemical sensors; Drug delivery; Mechanical sensors; Mechanical systems; Micromechanical devices; Predictive models; Printers; Sensor systems and applications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
Conference_Location :
Yokohama, Japan
Print_ISBN :
4-930813-97-2
Type :
conf
DOI :
10.1109/IMNC.1999.797545
Filename :
797545
Link To Document :
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