DocumentCode :
3222374
Title :
Potts MFT neural networks for recognition of partially occluded shapes
Author :
Suganthan, P.N. ; Teoh, E.K. ; Mital, D.P.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Volume :
2
fYear :
1995
fDate :
6-10 Nov 1995
Firstpage :
1417
Abstract :
In this paper, learning schemes are presented to optimally map the homomorphic graph matching problem onto the Potts mean field theory (MFT) neural networks. The computation of the weighting factors used in the compatibility measure equation is formulated as an optimization problem and solved using the quadratic programming procedure based learning algorithm. The formulation implicitly evaluates ambiguity, robustness and discriminatory power of the relational attributes chosen for graph matching and assigns weighting factors appropriately to these relational attributes. Further, the tolerance and steepness parameters are also learnt. These learning schemes also enable the construction of augmented weighted model attributed relational graphs (WARG). The proposed parameter learning schemes are employed to solve the silhouette objects recognition problem and the necessity for such learning schemes is also demonstrated
Keywords :
learning (artificial intelligence); neural nets; object recognition; quadratic programming; relational algebra; Potts mean field theory; ambiguity; augmented weighted model attributed relational graphs; compatibility measure equation; discriminatory power; graph matching; learning algorithm; learning schemes; neural networks; optimization problem; partially occluded shapes; quadratic programming procedure; relational attributes; robustness; silhouette objects recognition; steepness parameters; tolerance parameters; weighting factors; Clustering algorithms; Constraint optimization; Equations; Layout; Neural networks; Object recognition; Power engineering computing; Quadratic programming; Robustness; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1995., Proceedings of the 1995 IEEE IECON 21st International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3026-9
Type :
conf
DOI :
10.1109/IECON.1995.484158
Filename :
484158
Link To Document :
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