DocumentCode
3222475
Title
ESD Susceptibility of Thick Film Chip Resistors by Means of Transmission Line Pulsing
Author
Bonfert, D. ; Wolf, H. ; Gieser, H. ; Stocker, A.
Author_Institution
Fraunhofer Inst. Reliability & Microintegration, Munich
Volume
2
fYear
2006
fDate
5-7 Sept. 2006
Firstpage
947
Lastpage
953
Abstract
The change in resistance (dR) due to an applied high voltage pulse is a measure of the electrostatic discharge susceptibility of a resistor. The influence of the pulse width and height on the susceptibility was investigated on thick film chip resistors of different values and sizes. By means of the transmission line pulsing technique (TLP), the ESD behaviour of thick film chip resistors is presented
Keywords
electrostatic discharge; thick film resistors; electrostatic discharge susceptibility; thick film chip resistors; transmission line pulsing technique; Electrical resistance measurement; Electrostatic discharge; Electrostatic measurements; Pulse measurements; Resistors; Semiconductor device measurement; Thick films; Transmission line measurements; Transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location
Dresden
Print_ISBN
1-4244-0552-1
Electronic_ISBN
1-4244-0553-x
Type
conf
DOI
10.1109/ESTC.2006.280125
Filename
4060850
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