Title :
ESD Susceptibility of Thick Film Chip Resistors by Means of Transmission Line Pulsing
Author :
Bonfert, D. ; Wolf, H. ; Gieser, H. ; Stocker, A.
Author_Institution :
Fraunhofer Inst. Reliability & Microintegration, Munich
Abstract :
The change in resistance (dR) due to an applied high voltage pulse is a measure of the electrostatic discharge susceptibility of a resistor. The influence of the pulse width and height on the susceptibility was investigated on thick film chip resistors of different values and sizes. By means of the transmission line pulsing technique (TLP), the ESD behaviour of thick film chip resistors is presented
Keywords :
electrostatic discharge; thick film resistors; electrostatic discharge susceptibility; thick film chip resistors; transmission line pulsing technique; Electrical resistance measurement; Electrostatic discharge; Electrostatic measurements; Pulse measurements; Resistors; Semiconductor device measurement; Thick films; Transmission line measurements; Transmission lines; Voltage;
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Electronic_ISBN :
1-4244-0553-x
DOI :
10.1109/ESTC.2006.280125
