• DocumentCode
    3222604
  • Title

    Morphology and electrical conductivity of copper(II) 4-fluorobenzoate

  • Author

    Gani, Siti Meriam Ab ; Abdullah, Norbani ; Chang Fu, Dee

  • Author_Institution
    Dept. of Phys., Malaya Univ., Kuala Lumpur, Malaysia
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    157
  • Lastpage
    159
  • Abstract
    Copper(II) 4-fluorobenzoate (CFB), prepared from copper(II) acetate monohydrate and 4-fluorobenzoic acid, is a blue powder. The Fourier transform infrared spectrum of CFB, recorded as potassium bromide disc, indicates the presence of all bonds and functional groups expected of it. The X-ray diffraction pattern indicates that CFB is polycrystalline. The highest diffraction peak occurs at interplanar distance of 15.2 Å, which corresponds to particle size of 450 Å. Scanning electron microscopy of CFB shows that it has a layered structure. CFB conductivity at room temperature is 1.79×10-11 Scm-1. The value decreases as temperature increases in the temperature range 30-350 K, indicating metallic behaviour. The conduction mechanism obeys Mott´s variable range hopping (VRH) model in the temperature range 140-350 K. The density of states at Fermi level based on the VRH model is 2.9×1026 eV-1 cm -3. The hopping distance, hopping energy and density of charge carriers at 300 K are 0.73 Å, 0.002 eV and 7.53×10 24 cm-3, respectively
  • Keywords
    Fermi level; Fourier transform spectra; X-ray diffraction; copper compounds; electronic density of states; hopping conduction; organic compounds; particle size; scanning electron microscopy; 0.002 eV; 0.73 angstrom; 140 to 350 K; 15.2 angstrom; 17.9 pS/cm; 30 to 350 K; 300 K; 4-fluorobenzoic acid; 450 angstrom; CFB; CFB conductivity; Fermi level; Fourier transform infrared spectrum; Mott variable range hopping model; VRH model; X-ray diffraction pattern; blue powder; charge carrier density; conduction mechanism; copper(II) 4-fluorobenzoate; copper(II) acetate monohydrate; density of states; diffraction peak; electrical conductivity; functional groups; hopping distance; hopping energy; interplanar distance; layered structure; metallic behaviour; morphology; particle size; polycrystalline CFB; potassium bromide disc; scanning electron microscopy; temperature range; Conducting materials; Conductivity measurement; Fourier transforms; Morphology; Physics; Powders; Scanning electron microscopy; Temperature distribution; Thermal conductivity; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2000. Proceedings. ICSE 2000. IEEE International Conference on
  • Conference_Location
    Guoman Port Dickson Resort
  • Print_ISBN
    0-7803-6430-9
  • Type

    conf

  • DOI
    10.1109/SMELEC.2000.932455
  • Filename
    932455