Title :
Morphology and electrical conductivity of copper(II) 4-fluorobenzoate
Author :
Gani, Siti Meriam Ab ; Abdullah, Norbani ; Chang Fu, Dee
Author_Institution :
Dept. of Phys., Malaya Univ., Kuala Lumpur, Malaysia
Abstract :
Copper(II) 4-fluorobenzoate (CFB), prepared from copper(II) acetate monohydrate and 4-fluorobenzoic acid, is a blue powder. The Fourier transform infrared spectrum of CFB, recorded as potassium bromide disc, indicates the presence of all bonds and functional groups expected of it. The X-ray diffraction pattern indicates that CFB is polycrystalline. The highest diffraction peak occurs at interplanar distance of 15.2 Å, which corresponds to particle size of 450 Å. Scanning electron microscopy of CFB shows that it has a layered structure. CFB conductivity at room temperature is 1.79×10-11 Scm-1. The value decreases as temperature increases in the temperature range 30-350 K, indicating metallic behaviour. The conduction mechanism obeys Mott´s variable range hopping (VRH) model in the temperature range 140-350 K. The density of states at Fermi level based on the VRH model is 2.9×1026 eV-1 cm -3. The hopping distance, hopping energy and density of charge carriers at 300 K are 0.73 Å, 0.002 eV and 7.53×10 24 cm-3, respectively
Keywords :
Fermi level; Fourier transform spectra; X-ray diffraction; copper compounds; electronic density of states; hopping conduction; organic compounds; particle size; scanning electron microscopy; 0.002 eV; 0.73 angstrom; 140 to 350 K; 15.2 angstrom; 17.9 pS/cm; 30 to 350 K; 300 K; 4-fluorobenzoic acid; 450 angstrom; CFB; CFB conductivity; Fermi level; Fourier transform infrared spectrum; Mott variable range hopping model; VRH model; X-ray diffraction pattern; blue powder; charge carrier density; conduction mechanism; copper(II) 4-fluorobenzoate; copper(II) acetate monohydrate; density of states; diffraction peak; electrical conductivity; functional groups; hopping distance; hopping energy; interplanar distance; layered structure; metallic behaviour; morphology; particle size; polycrystalline CFB; potassium bromide disc; scanning electron microscopy; temperature range; Conducting materials; Conductivity measurement; Fourier transforms; Morphology; Physics; Powders; Scanning electron microscopy; Temperature distribution; Thermal conductivity; X-ray diffraction;
Conference_Titel :
Semiconductor Electronics, 2000. Proceedings. ICSE 2000. IEEE International Conference on
Conference_Location :
Guoman Port Dickson Resort
Print_ISBN :
0-7803-6430-9
DOI :
10.1109/SMELEC.2000.932455