Title :
Concurrent Error Detection in Digit-Serial Normal Basis Multiplication over GF(2m)
Author_Institution :
Lunghwa Univ. of Sci. & Technol., Guishan
Abstract :
Parity prediction schemes have been widely studied in the past. Recently, it has been demonstrated that this prediction scheme can achieve fault-secureness in arithmetic circuits for stuck-at and stuck-open faults. For most cryptographic applications, encryption/decryption algorithms rely on computations in very large finite fields. The hardware implementation may require millions of logic gates and this may lead to the generation of erroneous outputs by the multiplier. In this paper, a concurrent error detection (CED) technique is used in the digit-serial basis multiplier over finite fields of characteristic two. It is shown that all types of normal basis multipliers possess the same parity prediction function.
Keywords :
Galois fields; cryptography; digital arithmetic; error detection; logic gates; multiplying circuits; parity check codes; arithmetic circuits; concurrent error detection; cryptographic applications; digit-serial normal basis multiplication; encryption/decryption algorithms; fault-secureness; hardware implementation; logic gates; parity prediction schemes; stuck-open faults; Algorithm design and analysis; Arithmetic; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Elliptic curve cryptography; Fault detection; Galois fields; Polynomials; digit-serial multiplier; finite field; normal basis multiplier; parity prediction scheme;
Conference_Titel :
Advanced Information Networking and Applications - Workshops, 2008. AINAW 2008. 22nd International Conference on
Conference_Location :
Okinawa
Print_ISBN :
978-0-7695-3096-3
DOI :
10.1109/WAINA.2008.40