Title :
IEE Colloquium on Testing Mixed Signal Circuits and Systems (Ref. No.1997/361)
Abstract :
The following topics were dealt with: analogue BIST; field programmable analogue arrays; design for test; diagnostic reconfiguration methodology; filter testing; digital data compression techniques for mixed signal devices; mixed current/voltage testing; circuit fault diagnosis; virtual test environments; power supply current testing; fault detection; hierarchical modelling; analogue fault simulation
Keywords :
mixed analogue-digital integrated circuits; analogue BIST; analogue fault simulation; circuit fault diagnosis; design for test; diagnostic reconfiguration methodology; digital data compression techniques; fault detection; field programmable analogue arrays; filter testing; hierarchical modelling; mixed current/voltage testing; mixed signal circuits; mixed signal devices; power supply current testing; virtual test environments;
Conference_Titel :
Testing Mixed Signal Circuits and Systems (Ref. No: 1997/361), IEE Colloquium on
Conference_Location :
London
