Title :
Application of diffraction technology to UWB SAR research
Author :
Xue, Rui-Feng ; Yuan, Bin ; Mao, Jun-Fa
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., China
Abstract :
The application of diffraction technology to ultra wideband synthetic aperture radars (UWB SAR) was investigated to find an optimal solution to high-quality radar imagery. The microwave imagery criterion is presented and the spatial frequency coverage is introduced to evaluate imaging systems at first. Then radar imagery is analyzed with the comprehensive consideration of the scattering mechanisms, the data acquisition system, and the image reconstruction algorithm. Theoretical and numerical results show UWB SAR exploiting diffraction technology has the potential to realize high-resolution geometric imaging and probe inherent physical properties of targets. This provides a theoretical basis for formation flight and optimization of SAR systems.
Keywords :
data acquisition; electromagnetic wave diffraction; electromagnetic wave scattering; image reconstruction; image resolution; microwave imaging; optimisation; radar imaging; radar resolution; radar theory; synthetic aperture radar; UWB SAR; data acquisition system; diffraction technology; formation flight; high-quality radar imagery; high-resolution geometric imaging; image reconstruction algorithm; microwave imagery criterion; optimal solution; optimization; probe inherent physical properties; scattering mechanisms; spatial frequency coverage; ultra wideband synthetic aperture radars; Diffraction; Frequency; High-resolution imaging; Microwave imaging; Radar applications; Radar imaging; Radar scattering; Synthetic aperture radar; Ultra wideband radar; Ultra wideband technology;
Conference_Titel :
Radar Conference, 2004. Proceedings of the IEEE
Print_ISBN :
0-7803-8234-X
DOI :
10.1109/NRC.2004.1316474
