Title :
Capacitors-past, present, and future: a trans-national perspective
Author :
Sarjeant, W.J. ; Dollinger, R.E. ; Zirnheld, J. ; MacDougall, F.W. ; Goldberg, H.
Author_Institution :
State Univ. of New York, Buffalo, NY, USA
Abstract :
Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance
Keywords :
ageing; power capacitors; pulsed power technology; reliability; advanced manufacturing techniques; aging analysis; capacitor reliability; component performance prediction; diagnostic methodologies; dimensional analysis; fault tolerance; high energy pulse applications; life-cycle reliability; new materials; trans-national perspective; Capacitors; Dielectrics and electrical insulation; Filtering; Materials reliability; Passive filters; Performance analysis; Power conditioning; Power system reliability; Power transformer insulation; Pulse power systems;
Conference_Titel :
Power Modulator Symposium, 1996., Twenty-Second International
Conference_Location :
Boca Raton, FL
Print_ISBN :
0-7803-3076-5
DOI :
10.1109/MODSYM.1996.564488
